J.-C. Vildeuil: search on Z-Library

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1

Low frequency noise characterization in 0.13 μm p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 μm technologies on 1/f noise

M. Marin, Y. Akue Allogo, M. de Murcia, P. Llinares, J.C. Vildeuil

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 362 KB

english, 2004

2

Low frequency noise in gate and drain of PHEMT’s and related correlation

J.C Vildeuil, M Valenza, D Rigaud

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 392 KB

english, 2000

3

N-MOSFET oxide trap characterization induced by nitridation process using RTS noise analysis

C. Leyris, F. Martinez, A. Hoffmann, M. Valenza, J.C. Vildeuil

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 348 KB

english, 2007

4

[IEEE 2006 International Caribbean Conference on Devices, Circuits and Systems - Playa del Carmen, Mexico (2006.4.26-2006.4.26)] 2006 International Caribbean Conference on Devices, Circuits and Systems - Response of Correlated Double Sampling CMOS Imager Circuit to Random Telegraph Signal Noise

Leyris, C., Vildeuil, J-c., Roy, F., Martinez, F., Valenza, M., Hoffmann, A.

Year:

2006

File:

PDF, 5.32 MB

2006

5

[IEEE 2006 Proceedings of the 32nd European Solid-State Circuits Conference - Montreaux, Switzerland (2006.09.19-2006.09.21)] 2006 Proceedings of the 32nd European Solid-State Circuits Conference - Impact of Random Telegraph Signal in CMOS Image Sensors for Low-Light Levels

Leyris, C., Martinez, F., Valenza, M., Hoffmann, A., Vildeuil, J.C., Roy, F.

Year:

2006

Language:

english

File:

PDF, 1.01 MB

english, 2006

6

Effects of body biasing on the low frequency noise of MOSFETs from a 130 nm CMOS technology

Marin, M., Deen, M.J., de Murcia, M., Llinares, P., Vildeuil, J.C.

Journal:

IEE Proceedings - Circuits Devices and Systems

Year:

2004

Language:

english

File:

PDF, 1.44 MB

english, 2004

7

Low-frequency noise in III-V high-speed devices

Penarier, A., Jarrix, S.G., Delseny, C., Pascal, F., Vildeuil, J.C., Valenza, M., Rigaud, D.

Journal:

IEE Proceedings - Circuits Devices and Systems

Year:

2002

Language:

english

File:

PDF, 1.00 MB

english, 2002

8

Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 μm CMOS bipolar transistors

P. Benoit, J. Raoult, C. Delseny, F. Pascal, L. Snadny, J.-C. Vildeuil, M. Marin, B. Martinet, D. Cottin, O. Noblanc

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 521 KB

english, 2005

9

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Impact of grain number fluctuations in the MOS transistor gate on matching performance

Difrenza, R., Vildeuil, J.C., Llinares, P., Ghibaudo, G.

Year:

2003

Language:

english

File:

PDF, 338 KB

english, 2003

10

Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization

C. Leyris, F. Martinez, M. Valenza, A. Hoffmann, J.C. Vildeuil

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 211 KB

english, 2007

11

Impact of strained-channel n-MOSFETs with a SiGe virtual substrate on dielectric interface quality evaluated by low frequency noise measurements

G. Néau, F. Martinez, M. Valenza, J.C. Vildeuil, E. Vincent, F. Bœuf, F. Payet, K. Rochereau

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 474 KB

english, 2007

12

[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - A thorough investigation of progressive breakdown in ultra-thin oxides. Physical understanding and application for industrial reliability assessment

Monsieur, F., Vincent, E., Roy, D., Bruyere, S., Vildeuil, J.C., Pananakakis, G., Ghibaudo, G.

Year:

2002

Language:

english

File:

PDF, 722 KB

english, 2002

13

[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Transient radiation effects in CMOS/SOI transistors and circuits

Ferlet-Cavrois, V., Dupont-Nivet, E., Vildeuil, J.C., Musseau, O., Leray, J.L.

Year:

1998

Language:

english

File:

PDF, 648 KB

english, 1998

14

Response to “Comment on ‘Conduction and low frequency channel noise of GaAs based pseudomorphic high electron mobility transistors’ ” [J. Appl. Phys. 91, 3318 (2002)]

Valenza, M., Vildeuil, J. C., Rigaud, D.

Journal:

Journal of Applied Physics

Year:

2002

Language:

english

File:

PDF, 292 KB

english, 2002

15

SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise in Devices and Circuits - Effects of body biasing on the low-frequency noise of NMOSFETs from a 130-nm CMOS technology

Marin, Mathieu, Deen, M. Jamal, de Murcia, Mario, Llinares, Pierre, Vildeuil, Jean Charles, Deen, M. Jamal, Celik-Butler, Zeynep, Levinshtein, Michael E.

Year:

2003

Language:

english

File:

PDF, 321 KB

english, 2003

16

SPIE Proceedings [SPIE SPIE Third International Symposium on Fluctuations and Noise - Austin, TX (Monday 23 May 2005)] Noise in Devices and Circuits III - Trap competition inducing R.T.S noise in saturation range in N-MOSFETs

Leyris, C., Balandin, Alexander A., Danneville, Francois, Hoffmann, A., Valenza, M., Deen, M. Jamal, Fleetwood, Daniel M., Vildeuil, J.-C., Roy, F.

Year:

2005

Language:

english

File:

PDF, 232 KB

english, 2005

17

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Thin oxynitride solution for digital and mixed-signal 65nm CMOS platform

Tavel, B., Bidaud, M., Emonet, N., Barge, D., Planes, N., Brut, H., Roy, D., Vildeuil, J.C., Difrenza, R., Rochereau, K., Denais, M., Huard, V., Llinares, P., Bruyere, S., Parthasarthy, C., Revil, N.,

Year:

2003

Language:

english

File:

PDF, 280 KB

english, 2003

18

[IEEE 2006 IEEE Compound Semiconductor Integrated Circuit Symposium - San Antonio, TX, USA (2006.11.12-2006.11.15)] 2006 IEEE Compound Semiconductor Integrated Circuit Symposium - Advanced SiGe BiCMOS and CMOS platforms for Optical and Millimeter-Wave Integrated Circuits

Chevalier, P., Gloria, D., Scheer, P., Pruvost, S., Gianesello, F., Pourchon, F., Garcia, P., Vildeuil, J.-c., Chantre, A., Garnier, C., Noblanc, O., Voinigescu, S.P., Dickson, T.O., Laskin, E., Nicol

Year:

2006

Language:

english

File:

PDF, 4.86 MB

english, 2006

19

[IEEE Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005. - Santa Barbara, CA, USA (Oct. 9-11, 2005)] Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005. - Study of bipolar transistor matching at high current level with various test configurations leading to a new model approach

Bordez, S., Danaie, S., Difrenza, R., Vildeuil, J., Morin, G.

Year:

2005

Language:

english

File:

PDF, 654 KB

english, 2005

20

[IEEE 2006 IEEE International Conference on Microelectronic Test Structures - Austin, TX, USA (2006.03.6-2006.03.9)] 2006 IEEE International Conference on Microelectronic Test Structures - Impact of emitter resistance mismatch on base and collector current matching in bipolar transistors

Danaie, S., Perrotin, A., Ghibaudo, G., Vildeuil, J.-C., Morin, G., Laurens, M.

Year:

2006

Language:

english

File:

PDF, 276 KB

english, 2006

21

[IEEE International Conference on Microelectronic Test Structures - Goteborg, Sweden (15-18 March 1999)] ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) - CMOS 1/f noise modelling and extraction of BSIM3 parameters using a new extraction procedure

Vildeuil, J.C., Valenza, M., Rigaud, D.

Year:

1999

Language:

english

File:

PDF, 403 KB

english, 1999

22

SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise in Devices and Circuits II - Influence of the emitter-base junction depth on the low frequency noise of Si/SiGeC heterojunction bipolar transistors

Benoit, Patrice, Danneville, Francois, Bonani, Fabrizio, Chay, Cyril, Delseny, Colette, Deen, M. Jamal, Levinshtein, Michael E., Pascal, Fabien, Llinares, Pierre, Vildeuil, Jean-Charles, Baudry, Helen

Year:

2004

Language:

english

File:

PDF, 145 KB

english, 2004

23

[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - Understanding the Carbon Impact on Si/SiGe:C HBT Base Current Mismatch

Danaie, Stephane, Marin, Mathieu, Ghibaudo, Gerard, Vildeuil, Jean-Charles, Chouteau, Stephanie, Sicard, Isabelle, Monroy, Augustin

Year:

2007

Language:

english

File:

PDF, 2.77 MB

english, 2007

24

Oxide traps characterization of 45 nm MOS transistors by gate current R.T.S. noise measurements

F. Martinez, C. Leyris, G. Neau, M. Valenza, A. Hoffmann, J.C. Vildeuil, E. Vincent, F. Boeuf, T. Skotnicki, M. Bidaud, D. Barge, B. Tavel

Journal:

Microelectronic Engineering

Year:

2005

Language:

english

File:

PDF, 247 KB

english, 2005

25

Extraction of the BSIM3 1/f noise parameters in CMOS transistors

J.C. Vildeuil, M. Valenza, D. Rigaud

Journal:

Microelectronics Journal

Year:

1999

Language:

english

File:

PDF, 239 KB

english, 1999

26

1/f noise measurements in n-channel MOSFETs processed in 0.25 μm technology: Extraction of BSIM3v3 noise parameters

Y. Akue Allogo, M. de Murcia, J.C. Vildeuil, M. Valenza, P. Llinares, D. Cottin

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 163 KB

english, 2002

27

Conduction and low frequency channel noise of GaAs based pseudomorphic high electron mobility transistors

Valenza, M., Vildeuil, J. C., Rigaud, D.

Journal:

Journal of Applied Physics

Year:

2002

Language:

english

File:

PDF, 329 KB

english, 2002

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